Ion Beams in Materials Processing and Analysis /

Detalles Bibliográficos
Autores principales:	Schmidt, Bernd. (Autor), Wetzig, Klaus. (Autor)
Autor Corporativo:	SpringerLink (Online service)
Formato:	eBook
Lenguaje:	English
Publicado:	Vienna : Springer Vienna : Imprint: Springer, 2013.
Edición:	1st ed. 2013.
Materias:	Materials—Surfaces. Thin films. Atoms. Physics. Surfaces (Physics). Interfaces (Physical sciences). Surfaces and Interfaces, Thin Films. Atomic, Molecular, Optical and Plasma Physics. Surface and Interface Science, Thin Films.

Descripción
Descripción Física:	IX, 418 p. : online resource.
ISBN:	9783211993569

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