Ion Beams in Materials Processing and Analysis /

Detalles Bibliográficos
Autores principales: Schmidt, Bernd. (Autor), Wetzig, Klaus. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Vienna : Springer Vienna : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Materias:
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020 |a 9783211993569 
024 7 |a 10.1007/978-3-211-99356-9  |2 doi 
040 |a Sistema de Bibliotecas del Tecnológico de Costa Rica 
100 1 |a Schmidt, Bernd.  |e author. 
245 1 0 |a Ion Beams in Materials Processing and Analysis /  |c by Bernd Schmidt, Klaus Wetzig. 
250 |a 1st ed. 2013. 
260 # # |a Vienna :  |b Springer Vienna :  |b Imprint: Springer,  |c 2013. 
300 |a IX, 418 p. :  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
505 0 |a Preface -- 1. Introduction -- 2. Ion- Solid Interactions -- 2.1 Fundamental Principles -- 2.2 Binary Elastic Collisions -- 2.3 Ion Stopping -- 2.4 Ion Channeling -- 2.5 Ion Induced Target Modifications -- 3. Ion Beam Technology -- 3.1 Principles of Ion Accelerators -- 3.2 Ion Sources -- 3.3 Ion Acceleration -- 3.4 Ion Beam Handling -- 3.5 Ion Implantation Systems -- 3.6 Electrostatic Ion Accelerator Systems -- 3.7 Focused Ion Beam Systems -- 4. Materials Processing -- 4.1 Ion Irradiation Effects in Crystalline Materials -- 4.2 Ion Implantation into Semiconductors -- 4.3 Ion Beam Synthesis of New Phases in Solids -- 4.4 Ion Beam Mixing of Interfaces -- 4.5 Ion Beam Slicing of Thin Layers (Smart-Cut for SOI and Solar Cells) -- 4.6 Ion Beam Erosion, Sputtering and Surface Patterning (Ripples and Dots) -- 4.7 Ion Beam Shaping of Nanomaterials -- 4.8 Ion Beam Processing of other Materials -- 5. Ion Beam Preparation of Materials -- 5.1 Removal of Target Atoms by Sputtering -- 5.2 Effects on Sputtering Yield -- 5.3 Preparation Steps by Ion Beam Irradiation -- 5.4 Focus Ion Beam (FIB) Preparation -- 6. Ion Beam Analysis by Ion Beams -- 6.1 Introduction -- 6.2 Ion Beam Analytical Techniques – a Survey -- 6.3 Ion Beam Scattering Techniques -- 6.4 Ion Beam Induced Photon Emission -- 6.5 Nuclear Reaction Analysis (NRA) -- 6.6 Ion Beam Induced Electron and Light Emission -- 6.7 Secondary Ion Emission -- 6.8 Ion Beam Imaging Techniques -- 7. Special Ion Beam Applications in Materials Analysis Problems -- 7.1 Functional Thin Films and Layers -- 7.2 Ion Beam Analysis in Art and Archeometry -- 7.3 Special Applications in Life Sciences -- Index. 
650 0 |a Materials—Surfaces. 
650 0 |a Thin films. 
650 0 |a Atoms. 
650 0 |a Physics. 
650 0 |a Surfaces (Physics). 
650 0 |a Interfaces (Physical sciences). 
650 1 4 |a Surfaces and Interfaces, Thin Films. 
650 2 4 |a Atomic, Molecular, Optical and Plasma Physics. 
650 2 4 |a Surface and Interface Science, Thin Films. 
700 1 |a Wetzig, Klaus.  |e author. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
900 |a Libro descargado a ALEPH en bloque (proveniente de proveedor)