Ion Beams in Materials Processing and Analysis /

Ion Beams in Materials Processing and Analysis /

Bibliographic Details
Main Authors: Schmidt, Bernd. (Author), Wetzig, Klaus. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Vienna : Springer Vienna : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Subjects:
Materials-Surfaces.
Thin films.
Atoms.
Physics.
Surfaces (Physics).
Interfaces (Physical sciences).
Surfaces and Interfaces, Thin Films.
Atomic, Molecular, Optical and Plasma Physics.
Surface and Interface Science, Thin Films.

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