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01820nam a22003495i 4500 |
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100805s2010 xxu| s |||| 0|eng d |
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|a 9781441963482
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| 024 |
7 |
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|a 10.1007/978-1-4419-6348-2
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 100 |
1 |
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|a McPherson, J. W.
|e author.
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|a Reliability Physics and Engineering :
|b Time-To-Failure Modeling /
|c by J. W. McPherson.
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| 250 |
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|a 1st ed. 2010.
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| 260 |
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|a New York, NY :
|b Springer US :
|b Imprint: Springer,
|c 2010.
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| 300 |
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|a XIII, 318 p. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Materials and Device Degradation -- From Material/Device Degradation to Time-To-Failure -- Time-To-Failure Modeling -- Gaussian Statistics — An Overview -- Time-To-Failure Statistics -- Failure Rate Modeling -- Accelerated Degradation -- Acceleration Factor Modeling -- Ramp-to-Failure Testing -- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits -- Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering -- Conversion of Dynamical Stresses into Effective Static Values -- Increasing the Reliability of Device/Product Designs -- Erratum to: Materials and Device Degradation.
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|a Quality control.
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|a Reliability.
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|a Industrial safety.
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|a Electronics.
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|a Microelectronics.
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|a Mechanical engineering.
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|a Quality Control, Reliability, Safety and Risk.
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|a Electronics and Microelectronics, Instrumentation.
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|a Mechanical Engineering.
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|a SpringerLink (Online service)
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|t Springer eBooks
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