Reliability Physics and Engineering : Time-To-Failure Modeling /
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| Autor Corporativo: | |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2010.
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| Edición: | 1st ed. 2010. |
| Materias: |
Tabla de Contenidos:
- Materials and Device Degradation
- From Material/Device Degradation to Time-To-Failure
- Time-To-Failure Modeling
- Gaussian Statistics — An Overview
- Time-To-Failure Statistics
- Failure Rate Modeling
- Accelerated Degradation
- Acceleration Factor Modeling
- Ramp-to-Failure Testing
- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits
- Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering
- Conversion of Dynamical Stresses into Effective Static Values
- Increasing the Reliability of Device/Product Designs
- Erratum to: Materials and Device Degradation.