Silicon Devices and Process Integration : Deep Submicron and Nano-Scale Technologies /

Detalles Bibliográficos
Autor principal:	El-Kareh, Badih. (Autor)
Autor Corporativo:	SpringerLink (Online service)
Formato:	eBook
Lenguaje:	English
Publicado:	New York, NY : Springer US : Imprint: Springer, 2009.
Edición:	1st ed. 2009.
Materias:	Electronic circuits. Electronics. Microelectronics. Electrical engineering. Materials science. Circuits and Systems. Electronics and Microelectronics, Instrumentation. Electrical Engineering. Materials Science, general.

Tabla de Contenidos:

Properties of the Silicon Crystal. Valence-bond and energy-band models. Thermal equilibrium statistics. Carrier transport mechanisms. Non-equilibrium conditions and carrier lifetime
Junctions and Contacts. Ohmic, non-ohmic, and rectifying contacts. PN junctions, homo- and hetero-junctions. Contact und junction characterization, parameter extraction. Varactors
Junction Field-Effect Transistor, JFET. Structure and mode of operation. Physics of JFET. JFET characterization and parameter extraction. High-voltage applications. Parasitic effects
Bipolar Junction Transistor, BJT. Structure and mode of operation. Physics of BJT. Heterojunction Bipolar Transistor, HBT. Transistor characterization and parameter extraction. High-voltage applications
Parasitic effects.

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