Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /

Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /

Bibliographic Details
Main Author: Kalinin, Sergei (Editor)
Other Authors: Gruverman, Alexei (Editor, Editor/a)
Format: Book
Language:English
Published: New York, New York : Springer, c2007.
Subjects:
MICROSCOPIA DE EXPLORACION CON SONDA
MICROSCOPIOS ELECTRONICOS

Sistema de Bibliotecas de Universidad de Costa Rica

Holdings details from Sistema de Bibliotecas de Universidad de Costa Rica
Call Number: 502.825
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