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Solder joint reliability of BGA, CSP, flip chip, and fine pitch SMT assemblies /

Bibliographic Details
Main Authors: Lau, John H. (Author, Autor/a), Pao, Yi-Hsin (Autor/a)
Format: Book
Language:English
Published: New York : McGraw-Hill, c1997.
Series:Electronic Packaging and Interconnection Series / Charles M. Harper, series advisor
Subjects:

Sistema de Bibliotecas de Universidad de Costa Rica

Holdings details from Sistema de Bibliotecas de Universidad de Costa Rica
Call Number: 621.381.046
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