System-on-chip test architectures : nanometer design for testability /
Otros Autores: | Laung-Terng, Wang (Editor , Editor/a), Stroud, Charles E. (Editor , Editor/a), Touba, Nur A. (Editor , Editor/a) |
---|---|
Formato: | Libro |
Lenguaje: | English |
Publicado: |
Amsterdam :
Elsevier,
c2008.
|
Colección: | The Morgan Kaufmann Series in Systems on Silicon / series editor Wayne Wolf, Georgia Institute of Technology
|
Materias: |
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