VLSI test principles and architectures : design for testability /
Autor principal: | Laung-Terng, Wang (Editor ) |
---|---|
Otros Autores: | Cheng-Wen, Wu (Editor , Editor/a), Xiaoqing, Wen (Editor , Editor/a) |
Formato: | Libro |
Lenguaje: | English |
Publicado: |
Amsterdam :
Elsevier,
c2006.
|
Colección: | The Morgan Kaufmann Series in Systems on Silicon / series editor Wayne Wolf, Georgia Institute of Technology
|
Materias: |
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