Introduction to focused ion beam nanometrology /

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Introduction to focused ion beam nanometrology /

Bibliographic Details
Main Author:	Cox, David Christopher 1965- (Autor/a)
Format:	Book
Language:	English
Published:	San Rafael, CA : Morgan & Claypool Publishers, c2015.
Series:	IOP Concise Physics
Subjects:	HAZ DE IONES ENFOCADOS MATERIALES NANOESTRUCTURADOS > MEDICIONES CIENCIA DE LOS MATERIALES
Online Access:	Ver documento en línea

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