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01503nam a22003255i 4500 |
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20211027083701.0 |
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cr nn 008mamaa |
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100301s2008 ne | s |||| 0|eng d |
| 020 |
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|a 9781402083631
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| 024 |
7 |
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|a 10.1007/978-1-4020-8363-1
|2 doi
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| 040 |
|
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 100 |
1 |
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|a Pavlov, Andrei.
|e author.
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| 245 |
1 |
0 |
|a CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies :
|b Process-Aware SRAM Design and Test /
|c by Andrei Pavlov, Manoj Sachdev.
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| 250 |
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|a 1st ed. 2008.
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| 260 |
# |
# |
|a Dordrecht :
|b Springer Netherlands :
|b Imprint: Springer,
|c 2008.
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| 300 |
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|a XVI, 194 p. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Frontiers in Electronic Testing,
|v 40
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| 505 |
0 |
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|a and Motivation -- SRAM Circuit Design and Operation -- SRAM Cell Stability: Definition, Modeling and Testing -- Traditional SRAM Fault Models and Test Practices -- Techniques for Detection of SRAM Cells with Stability Faults -- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.
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| 650 |
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0 |
|a Electronic circuits.
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| 650 |
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0 |
|a Computer memory systems.
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| 650 |
1 |
4 |
|a Circuits and Systems.
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| 650 |
2 |
4 |
|a Memory Structures.
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| 700 |
1 |
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|a Sachdev, Manoj.
|e author.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 900 |
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|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
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