CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test /
| Autores principales: | , |
|---|---|
| Autor Corporativo: | |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2008.
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| Edición: | 1st ed. 2008. |
| Colección: | Frontiers in Electronic Testing,
40 |
| Materias: |
Tabla de Contenidos:
- and Motivation
- SRAM Circuit Design and Operation
- SRAM Cell Stability: Definition, Modeling and Testing
- Traditional SRAM Fault Models and Test Practices
- Techniques for Detection of SRAM Cells with Stability Faults
- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.