CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test /
| Main Authors: | , |
|---|---|
| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2008.
|
| Edition: | 1st ed. 2008. |
| Series: | Frontiers in Electronic Testing,
40 |
| Subjects: |
Table of Contents:
- and Motivation
- SRAM Circuit Design and Operation
- SRAM Cell Stability: Definition, Modeling and Testing
- Traditional SRAM Fault Models and Test Practices
- Techniques for Detection of SRAM Cells with Stability Faults
- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.