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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test /

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test /

Bibliographic Details
Main Authors: Pavlov, Andrei. (Author), Sachdev, Manoj. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Series:Frontiers in Electronic Testing, 40
Subjects:
Electronic circuits.
Computer memory systems.
Circuits and Systems.
Memory Structures.

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