CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test /

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test /

Bibliographic Details
Main Authors: Pavlov, Andrei. (Author), Sachdev, Manoj. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Series:Frontiers in Electronic Testing, 40
Subjects:
Electronic circuits.
Computer memory systems.
Circuits and Systems.
Memory Structures.

Sistema de Bibliotecas del Tecnológico de Costa Rica

Holdings details from Sistema de Bibliotecas del Tecnológico de Costa Rica
Copy Available

Similar Items