Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations /

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Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations /

Detalles Bibliográficos
Autor principal:	Garg, Rajesh
Formato:	eBook
Lenguaje:	English
Publicado:	Nueva York, Estados Unidos : Springer, 2010.
Edición:	1 edición
Materias:	Circuitos electrónicos Radiación > Efectos Algoritmos Circuitos > Diseño Automatización del diseño Modelado Libros electrónicos

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