Extreme Statistics in Nanoscale Memory Design /

Extreme Statistics in Nanoscale Memory Design /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Singhee, Amith. (Editor), Rutenbar, Rob A. (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Series:Integrated Circuits and Systems,
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Description
Physical Description:X, 246 p. : online resource.
ISBN:9781441966063

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