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01599nam a22003375i 4500 |
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20210729134052.0 |
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cr nn 008mamaa |
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100917s2010 xxu| s |||| 0|eng d |
| 020 |
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|a 9781441966063
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| 024 |
7 |
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|a 10.1007/978-1-4419-6606-3
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 245 |
1 |
0 |
|a Extreme Statistics in Nanoscale Memory Design /
|c edited by Amith Singhee, Rob A. Rutenbar.
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| 250 |
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|a 1st ed. 2010.
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| 260 |
# |
# |
|a New York, NY :
|b Springer US :
|b Imprint: Springer,
|c 2010.
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| 300 |
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|a X, 246 p. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Integrated Circuits and Systems,
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| 505 |
0 |
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|a Extreme Statistics in Memories -- Statistical Nano CMOS Variability and Its Impact on SRAM -- Importance Sampling-Based Estimation: Applications to Memory Design -- Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics -- Yield Estimation by Computing Probabilistic Hypervolumes -- Most Probable Point-Based Methods -- Extreme Value Theory: Application to Memory Statistics.
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| 650 |
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|a Electronic circuits.
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| 650 |
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|a Electronics.
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| 650 |
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|a Microelectronics.
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| 650 |
1 |
4 |
|a Circuits and Systems.
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| 650 |
2 |
4 |
|a Electronics and Microelectronics, Instrumentation.
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| 700 |
1 |
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|a Singhee, Amith.
|e editor.
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| 700 |
1 |
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|a Rutenbar, Rob A.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 900 |
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|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
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