Extreme Statistics in Nanoscale Memory Design /
Autor Corporativo: | SpringerLink (Online service) |
---|---|
Otros Autores: | Singhee, Amith. (Editor ), Rutenbar, Rob A. (Editor ) |
Formato: | eBook |
Lenguaje: | English |
Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2010.
|
Edición: | 1st ed. 2010. |
Colección: | Integrated Circuits and Systems,
|
Materias: |
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