Extreme Statistics in Nanoscale Memory Design /
| Corporate Author: | |
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
New York, NY :
Springer US : Imprint: Springer,
2010.
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| Edition: | 1st ed. 2010. |
| Series: | Integrated Circuits and Systems,
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| Subjects: |
Table of Contents:
- Extreme Statistics in Memories
- Statistical Nano CMOS Variability and Its Impact on SRAM
- Importance Sampling-Based Estimation: Applications to Memory Design
- Direct SRAM Operation Margin Computation with Random Skews of Device Characteristics
- Yield Estimation by Computing Probabilistic Hypervolumes
- Most Probable Point-Based Methods
- Extreme Value Theory: Application to Memory Statistics.