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cr nn 008mamaa |
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130913s2013 xxu| s |||| 0|eng d |
| 020 |
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|a 9781461486602
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| 024 |
7 |
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|a 10.1007/978-1-4614-8660-2
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 100 |
1 |
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|a Joy, David C.
|e author.
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| 245 |
1 |
0 |
|a Helium Ion Microscopy :
|b Principles and Applications /
|c by David C. Joy.
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| 250 |
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|a 1st ed. 2013.
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| 260 |
# |
# |
|a New York, NY :
|b Springer New York :
|b Imprint: Springer,
|c 2013.
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| 300 |
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|a VIII, 64 p. 29 illus., 16 illus. in color. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a SpringerBriefs in Materials,
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| 505 |
0 |
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|a Chapter 1: Introduction to Helium Ion Microscopy -- Chapter 2: Microscopy with Ions - A brief history -- Chapter 3: Operating the Helium Ion Microscope -- Chapter 4: Ion –Solid Interactions and Image Formation -- Chapter 5: Charging and Damage -- Chapter 6: Microanalysis with the HIM -- Chapter 7: Ion Generated Damage -- Chapter 8: Working with other Ion beams -- Chapter 9: Patterning and Nanofabrication -- Conclusion -- Bibliography -- Appendix: iSE Yields, and IONiSE parameters for He+ excitation of Elements and Compounds -- Index.
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| 650 |
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0 |
|a Materials science.
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| 650 |
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0 |
|a Spectroscopy.
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| 650 |
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0 |
|a Microscopy.
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| 650 |
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0 |
|a Nanotechnology.
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| 650 |
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0 |
|a Nanoscale science.
|
| 650 |
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0 |
|a Nanoscience.
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| 650 |
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0 |
|a Nanostructures.
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| 650 |
1 |
4 |
|a Characterization and Evaluation of Materials.
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| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
|
| 650 |
2 |
4 |
|a Spectroscopy/Spectrometry.
|
| 650 |
2 |
4 |
|a Nanotechnology.
|
| 650 |
2 |
4 |
|a Nanoscale Science and Technology.
|
| 710 |
2 |
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|a SpringerLink (Online service)
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| 900 |
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|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
|