Helium Ion Microscopy : Principles and Applications /
Autor principal: | |
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Autor Corporativo: | |
Formato: | eBook |
Lenguaje: | English |
Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2013.
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Edición: | 1st ed. 2013. |
Colección: | SpringerBriefs in Materials,
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Materias: |
Tabla de Contenidos:
- Chapter 1: Introduction to Helium Ion Microscopy
- Chapter 2: Microscopy with Ions - A brief history
- Chapter 3: Operating the Helium Ion Microscope
- Chapter 4: Ion –Solid Interactions and Image Formation
- Chapter 5: Charging and Damage
- Chapter 6: Microanalysis with the HIM
- Chapter 7: Ion Generated Damage
- Chapter 8: Working with other Ion beams
- Chapter 9: Patterning and Nanofabrication
- Conclusion
- Bibliography
- Appendix: iSE Yields, and IONiSE parameters for He+ excitation of Elements and Compounds
- Index.