Helium Ion Microscopy : Principles and Applications /

Bibliographic Details
Main Author: Joy, David C. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:SpringerBriefs in Materials,
Subjects:
Table of Contents:
  • Chapter 1: Introduction to Helium Ion Microscopy
  • Chapter 2: Microscopy with Ions  - A brief history
  • Chapter 3: Operating the Helium Ion Microscope
  • Chapter 4: Ion -Solid  Interactions  and Image Formation
  • Chapter 5: Charging and  Damage
  • Chapter 6: Microanalysis with the HIM
  • Chapter 7: Ion Generated Damage
  • Chapter 8: Working with other Ion beams
  • Chapter 9: Patterning and Nanofabrication
  • Conclusion
  • Bibliography
  • Appendix: iSE Yields,  and IONiSE  parameters for  He+ excitation  of Elements and Compounds
  • Index.