Precision Nanometrology : Sensors and Measuring Systems for Nanomanufacturing /

Precision Nanometrology : Sensors and Measuring Systems for Nanomanufacturing /

Detalles Bibliográficos
Autor principal: Gao, Wei. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: London : Springer London : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Colección:Springer Series in Advanced Manufacturing,
Materias:
Nanotechnology.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Control engineering.
Robotics.
Mechatronics.
Manufactures.
Physical measurements.
Measurement   .
Nanotechnology and Microengineering.
Surface and Interface Science, Thin Films.
Control, Robotics, Mechatronics.
Manufacturing, Machines, Tools, Processes.
Measurement Science and Instrumentation.

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