Silicon Devices and Process Integration : Deep Submicron and Nano-Scale Technologies /

Silicon Devices and Process Integration : Deep Submicron and Nano-Scale Technologies /

Bibliographic Details
Main Author: El-Kareh, Badih. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2009.
Edition:1st ed. 2009.
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Electrical engineering.
Materials science.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Electrical Engineering.
Materials Science, general.
Table of Contents:
  • Properties of the Silicon Crystal. Valence-bond and energy-band models. Thermal equilibrium statistics. Carrier transport mechanisms. Non-equilibrium conditions and carrier lifetime
  • Junctions and Contacts. Ohmic, non-ohmic, and rectifying contacts. PN junctions, homo- and hetero-junctions. Contact und junction characterization, parameter extraction. Varactors
  • Junction Field-Effect Transistor, JFET. Structure and mode of operation. Physics of JFET. JFET characterization and parameter extraction. High-voltage applications. Parasitic effects
  • Bipolar Junction Transistor, BJT. Structure and mode of operation. Physics of BJT. Heterojunction Bipolar Transistor, HBT. Transistor characterization and parameter extraction. High-voltage applications
  • Parasitic effects.

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