Wire bonding in microelectronics : materials, processes, reliability, and yield /

Bibliographic Details
Main Author: Harman, George G. (Author, Autor/a)
Format: Book
Language:English
Published: New York : McGraw-Hill, c1997.
Edition:2. edition
Series:Electronic Packaging and Interconnection Series / Charles M. Harper, series advisor
Subjects:
LEADER 01002nam a2200289uu 4500
001 000199821
005 20091023151815.0
008 090921s1997 xxu ||||| eng
020 |a 9780070326194 
035 |a 9240898 
040 |a Sistema de Bibliotecas de Universidad de Costa Rica  
041 0 |a eng 
082 0 |a 621.381.5  |b G287w2  |2 22 
100 1 |a Harman, George G.  |e Autor/a  |4 aut 
245 1 0 |a Wire bonding in microelectronics :  |b materials, processes, reliability, and yield /  |c George G. Harman 
250 |a 2. edition 
260 |a New York :  |b McGraw-Hill,  |c c1997. 
300 |a xiv, 290 páginas :  |b ilustraciones 
490 0 |a Electronic Packaging and Interconnection Series / Charles M. Harper, series advisor 
650 |a MICROELECTRONICA 
650 |a ENCAPSULADO ELECTRONICO 
650 |a SEMICONDUCTORES 
900 |a 2009 
912 |a 23-OCT-2009 - GARRIDO CORDERO, IRINA 
917 |a 21-SEP-2009 - BUSTAMANTE MORA, CYNTHIA 
949 |a IG -EMQ 
916 |a Centro Catalográfico