An introduction to time-of-flight secondary Ion Mass Spectrometry (ToF-SIMS) and its application to materials science /
| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
San Rafael, California :
Morgan & Claypool Publishers,
c2015.
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| Series: | IOP Concise Physics
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| Subjects: | |
| Online Access: | Ver documento en línea |
Internet
Ver documento en líneaSistema de Bibliotecas de Universidad de Costa Rica
| Call Number: |
543.65 |
|---|---|
| Copy | Available |