Accelerating test, validation and debug of high speed serial interfaces /

Bibliographic Details
Main Author: Fan, Yongquan (Autor/a)
Other Authors: Zilic, Zeljko (Autor/a)
Format: Book
Language:English
Published: New York : Springer, c2011.
Series:Accelerating test, validation and debug of high speed serial interfaces
Subjects:
Online Access:Ver documento en línea

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