Scanning electron microscopy and X-Ray microanalysis /

Scanning electron microscopy and X-Ray microanalysis /

Bibliographic Details
Main Author: Goldstein, Joseph I. (autor)
Other Authors: Newbury, Dale E. (autor), Echlin, Patrick (autor), Joy, David C., 1943- (autor), Lyman, Charles E. (autor), Lifshin, Eric (autor), Sawyer, Linda (autor), Michael, Joseph R. (autor)
Format: Book
Language:English
Published: [New York] : Springer, c2003.
Edition:Third edition
Subjects:
MICROSCOPIOS
MICROSCOPIA ELECTRÓNICA
RAYOS X

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