Scanning electron microscopy and x-ray microanalysis /

Bibliographic Details
Other Authors: Echlin, Patrick, Goldstein, Joseph I., Joy, David C., Lifshin, Eric, Lyman, Charles E., Michael, Joseph R., Newbury, Dale E., Sawyer, Linda
Format: Book
Language:English
Published: New York : Springer, 2003.
Edition:3 edition
Subjects:
Description
Physical Description:690 páginas : ilustraciones, figuras + 1 disco de computadora
ISBN:9780306472923