Scanning electron microscopy and x-ray microanalysis /
Other Authors: | Echlin, Patrick, Goldstein, Joseph I., Joy, David C., Lifshin, Eric, Lyman, Charles E., Michael, Joseph R., Newbury, Dale E., Sawyer, Linda |
---|---|
Format: | Book |
Language: | English |
Published: |
New York :
Springer,
2003.
|
Edition: | 3 edition |
Subjects: |
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