Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations /

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Analysis and design of resilient VLSI circuits : mitigating soft errors and process variations /

Bibliographic Details
Main Author:	Garg, Rajesh
Format:	eBook
Language:	English
Published:	Nueva York, Estados Unidos : Springer, 2010.
Edition:	1 edición
Subjects:	Circuitos electrónicos Radiación > Efectos Algoritmos Circuitos > Diseño Automatización del diseño Modelado Libros electrónicos

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