Analog IC reliability in nanometer CMOS /
| Main Author: | |
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| Other Authors: | |
| Format: | eBook |
| Language: | English |
| Published: |
Nueva York, Estados Unidos :
Springer,
2013.
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| Edition: | 1 edición |
| Subjects: |
| Item Description: | Base de Datos SPRINGER |
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| Physical Description: | 1 recurso en línea : diagramas, fotografías, gráficas. |
| Bibliography: | Referencias |
| ISBN: | 9781461461630 |