Advanced computing in electron microscopy /

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Advanced computing in electron microscopy /

Detalles Bibliográficos
Autor principal:	Kirkland, Earl J.
Formato:	Libro
Lenguaje:	English
Publicado:	New York, Estados Unidos : Springer, 2010.
Edición:	2 edición
Materias:	Microscopía electrónica > Simulación por computadoras Espectroscopía Ingeniería eléctrica Ciencia de los materiales Análisis numérico > Computación Libros electrónicos

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