Electromigration Modeling at Circuit Layout Level /

Detalles Bibliográficos
Autores principales:	Tan, Cher Ming. (Autor), He, Feifei. (Autor)
Autor Corporativo:	SpringerLink (Online service)
Formato:	eBook
Lenguaje:	English
Publicado:	Singapore : Springer Singapore : Imprint: Springer, 2013.
Edición:	1st ed. 2013.
Colección:	SpringerBriefs in Reliability,
Materias:	Quality control. Reliability. Industrial safety. Electronic circuits. Atoms. Physics. Quality Control, Reliability, Safety and Risk. Electronic Circuits and Devices. Atomic, Molecular, Optical and Plasma Physics.

Descripción
Descripción Física:	IX, 103 p. 75 illus., 2 illus. in color. : online resource.
ISBN:	9789814451215

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