Electromigration Modeling at Circuit Layout Level /
Autores principales: | Tan, Cher Ming. (Autor), He, Feifei. (Autor) |
---|---|
Autor Corporativo: | SpringerLink (Online service) |
Formato: | eBook |
Lenguaje: | English |
Publicado: |
Singapore :
Springer Singapore : Imprint: Springer,
2013.
|
Edición: | 1st ed. 2013. |
Colección: | SpringerBriefs in Reliability,
|
Materias: |
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