Electromigration Modeling at Circuit Layout Level /

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Electromigration Modeling at Circuit Layout Level /

Bibliographic Details
Main Authors:	Tan, Cher Ming. (Author), He, Feifei. (Author)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Singapore : Springer Singapore : Imprint: Springer, 2013.
Edition:	1st ed. 2013.
Series:	SpringerBriefs in Reliability,
Subjects:	Quality control. Reliability. Industrial safety. Electronic circuits. Atoms. Physics. Quality Control, Reliability, Safety and Risk. Electronic Circuits and Devices. Atomic, Molecular, Optical and Plasma Physics.

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