Extreme Statistics in Nanoscale Memory Design /

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Extreme Statistics in Nanoscale Memory Design /

Bibliographic Details
Corporate Author:	SpringerLink (Online service)
Other Authors:	Singhee, Amith. (Editor), Rutenbar, Rob A. (Editor)
Format:	eBook
Language:	English
Published:	New York, NY : Springer US : Imprint: Springer, 2010.
Edition:	1st ed. 2010.
Series:	Integrated Circuits and Systems,
Subjects:	Electronic circuits. Electronics. Microelectronics. Circuits and Systems. Electronics and Microelectronics, Instrumentation.

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