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120928s2013 xxu| s |||| 0|eng d |
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|a 9781461417491
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| 024 |
7 |
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|a 10.1007/978-1-4614-1749-1
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 100 |
1 |
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|a Abu Rahma, Mohamed.
|e author.
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| 245 |
1 |
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|a Nanometer Variation-Tolerant SRAM :
|b Circuits and Statistical Design for Yield /
|c by Mohamed Abu Rahma, Mohab Anis.
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| 250 |
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|a 1st ed. 2013.
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| 260 |
# |
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|a New York, NY :
|b Springer New York :
|b Imprint: Springer,
|c 2013.
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| 300 |
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|a XVI, 172 p. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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|a Introduction -- Variability in Nanometer Technologies and Impact on SRAM -- Variarion-Tolerant SRAM Write and Read Assist Techniques -- Reducing SRAM Power using Fine-Grained Wordline Pulse Width Control -- A Methodology for Statistical Estimation of Read Access Yield in SRAMs -- Characterization of SRAM Sense Amplifier Input Offset for Yield Prediction.
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|a Electronic circuits.
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|a Computer-aided engineering.
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|a Circuits and Systems.
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|a Computer-Aided Engineering (CAD, CAE) and Design.
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| 700 |
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|a Anis, Mohab.
|e author.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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