Nanometer Variation-Tolerant SRAM : Circuits and Statistical Design for Yield /

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Nanometer Variation-Tolerant SRAM : Circuits and Statistical Design for Yield /

Detalles Bibliográficos
Autores principales:	Abu Rahma, Mohamed. (Autor), Anis, Mohab. (Autor)
Autor Corporativo:	SpringerLink (Online service)
Formato:	eBook
Lenguaje:	English
Publicado:	New York, NY : Springer New York : Imprint: Springer, 2013.
Edición:	1st ed. 2013.
Materias:	Electronic circuits. Computer-aided engineering. Circuits and Systems. Computer-Aided Engineering (CAD, CAE) and Design.

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