Defect-oriented testing for nano-metric CMOS VLSI circuits /
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Dordrecht, Países Bajos :
Springer,
2007.
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| Edition: | 2 edición |
| Subjects: |
Sistema de Bibliotecas del Tecnológico de Costa Rica
| Copy | Available |
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