Defect-oriented testing for nano-metric CMOS VLSI circuits /
Autor principal: | Sachdev, Manoj |
---|---|
Otros Autores: | Pineda-de-Gyvez, José (creador) |
Formato: | Libro |
Lenguaje: | English |
Publicado: |
Dordrecht, Países Bajos :
Springer,
2007.
|
Edición: | 2 edición |
Materias: |
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