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Failure modes and mechanisms in electronic packages /

Failure modes and mechanisms in electronic packages /

Bibliographic Details
Main Authors: Viswanadham, Puligandla (Author, Autor/a), Singh, Patrap (Autor/a)
Format: Book
Language:English
Published: New York : Chapman & Hall, c1998.
Subjects:
INDUSTRIAS ELECTRONICAS
CONTROL DE CALIDAD
ELECTRONICA
SEMICONDUCTORES
ENCAPSULADO ELECTRONICO

Sistema de Bibliotecas de Universidad de Costa Rica

Holdings details from Sistema de Bibliotecas de Universidad de Costa Rica
Call Number: 621.381.046
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