Scanning electron microscopy and x-ray microanalysis /
| Other Authors: | , , , , , , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer,
2003.
|
| Edition: | 3 edition |
| Subjects: |
Sistema de Bibliotecas del Tecnológico de Costa Rica
| Call Number: |
502.825 |
|---|---|
| Copy | Available |