Electromigration Modeling at Circuit Layout Level /

Electromigration Modeling at Circuit Layout Level /

Bibliographic Details
Main Authors: Tan, Cher Ming. (Author), He, Feifei. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Singapore : Springer Singapore : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:SpringerBriefs in Reliability,
Subjects:
Quality control.
Reliability.
Industrial safety.
Electronic circuits.
Atoms.
Physics.
Quality Control, Reliability, Safety and Risk.
Electronic Circuits and Devices.
Atomic, Molecular, Optical and Plasma Physics.

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