Defect-oriented testing for nano-metric CMOS VLSI circuits /
Main Author: | Sachdev, Manoj |
---|---|
Other Authors: | Pineda-de-Gyvez, José (creador) |
Format: | Book |
Language: | English |
Published: |
Dordrecht, Países Bajos :
Springer,
2007.
|
Edition: | 2 edición |
Subjects: |
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