Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits /

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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits /

Bibliographic Details
Main Author:	Bushnell, Michael L.
Other Authors:	Agrawal, Vishwani D. (creador)
Format:	Book
Language:	English
Published:	Nueva York ; Boston ; Países Bajos ; Londres ; Moscú : Kluwer Academic Publishers, 2000.
Edition:	1 edición
Subjects:	Circuitos integrados > Pruebas Circuitos integrados digitales > Pruebas Circuitos de señal mixta > Pruebas Dispositivos de almacenamiento > Pruebas Libros electrónicos

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