Nanometer Technology Designs High-Quality Delay Tests /

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Nanometer Technology Designs High-Quality Delay Tests /

Bibliographic Details
Main Author:	Ahmed, Nisar. (Author)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	New York, NY : Springer US : Imprint: Springer, 2008.
Edition:	1st ed. 2008.
Subjects:	Electronic circuits. Electronics. Microelectronics. Computer-aided engineering. Nanotechnology. Electrical engineering. Circuits and Systems. Electronics and Microelectronics, Instrumentation. Computer-Aided Engineering (CAD, CAE) and Design. Electrical Engineering.
Online Access:	https://doi.org/10.1007/978-0-387-75728-5

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