Nanometer Variation-Tolerant SRAM : Circuits and Statistical Design for Yield /

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Nanometer Variation-Tolerant SRAM : Circuits and Statistical Design for Yield /

Bibliographic Details
Main Authors:	Abu Rahma, Mohamed. (Author), Anis, Mohab. (Author)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	New York, NY : Springer New York : Imprint: Springer, 2013.
Edition:	1st ed. 2013.
Subjects:	Electronic circuits. Computer-aided engineering. Circuits and Systems. Computer-Aided Engineering (CAD, CAE) and Design.

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